Session: Radiation Physics and Chemistry, Instrumentation and Materials Characterization

 • Fundamental processes in radiation physics

• Interaction mechanisms for example scattering and absorption of photon and particle radiations

• Mathematical methods in radiation physics, reference data

• Radiation sources, detectors and detector materials (gas, scintillation, semiconductor detector etc..) 

• Accelerator and radionuclide spectra and other properties

• Radiation fields from point and extended sources

• Detector response functions

• Radiation shielding materials 

• Advanced Characterization Techniques such as X-Ray Diffraction (XRD), X-Ray Fluorescence Spectroscopy (XRF), X-Ray Imaging Tomography (XTM), X-Ray Absorption Spectroscopy (XAS), X-Ray Photoelectron Spectroscopy (XPS), Raman and Optical Spectroscopies, Electron Microscope, Scanning Probe Microscopy Methods etc.